Department of Electronics and Electrical Engineering

  • Dr. M. K. Bhuyan

    Professor, Department of Electronics & Electrical Engineering, and Associate Dean of Infrastructure Planning and Management (IPM), Indian Institute of Technology Guwahati, Assam, INDIA.


    Prof. Manas Kamal Bhuyan received a Ph.D. degree in electronics and communication engineering from the India Institute of Technology (IIT) Guwahati, India. He was with the School of Information Technology and Electrical Engineering, University of Queensland, St. Lucia, QLD, Australia, where he was involved in postdoctoral research. Subsequently, he was a Researcher with the SAFE Sensor Research Group, NICTA, Brisbane, QLD, Australia. He was an Assistant Professor with the Department of Electrical Engineering, IIT Roorkee, India and Jorhat Engineering College, Assam, India, and also worked in IE services. In 2014, he was a Visiting Professor with Indiana University and Purdue University, Indiana, USA.  Dr. Bhuyan was a recipient of the National Award for Best Applied Research/Technological Innovation, which was presented by the Honorable President of India in the year 2012, the Prestigious Fullbright-Nehru Academic and Professional Excellence Fellowship, and the BOYSCAST Fellowship. He is an IEEE senior member. He is currently a Professor with the Department of Electronics and Electrical Engineering, IIT Guwahati, and Associate Dean of Infrastructure, Planning and Management, IIT Guwahati. His current research interests include image/video processing, computer vision, machine learning and human computer interactions (HCI), virtual reality and augmented reality. He has almost 25 years of industry, teaching, and research experience. He is the author of the text book "Computer Vision and Image Processing: Fundamentals and Applications", published by CRC press, USA, 2019.


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    Computer Vision and Image Processing: Fundamentals and Applications, published by CRC press, USA, 2019. (TEXT BOOK).

    It is a text book on Computer Vision, and the book has been published by CRC Press, USA.

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