Dr. Alika Khare
Professor (HAG)
Department of Physics
Indian Institute of Technology Guwahati
Guwahati - 781 039, India
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IIT Guwahati
www.iitg.ernet.in
Department Time Table
Time Table for jan - may 2013
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Patent
System, apparatus and method for monitoring of surface profile and thickness measurement in thin films,
Application no. 4088/DEL/2015.
System, apparatus and method for monitoring of surface profile and thickness measurement in thin films,
Application no. PCT/IB2016/054261.